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TFS: Combined Tilt- and Focal Series for Scanning Transmission Electron Microscopy.
In
Proceedings of Microscopy & Microanalysis 2014, Hartford, CA, September, 2014
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DOI
Authors
Tim Dahmen
Philipp Slusallek
Niels de Jonge
© Lehrstuhl Computer Graphik,
Universität des Saarlandes
, 1999-2024.
