Tim Dahmen

Tim Dahmen

Dr. Tim Dahmen
Team Leader Computational 3D Imaging

Deutsches Forschungszentrum für Künstliche Intelligenz GmbH, DFKI
Agenten und Simulierte Realität
Saarland Informatics Campus D3.2
Raum 0.76NB (0.12 3.BA)
Stuhlsatzenhausweg 3
D-66123 Saarbrücken

Tel.: +49 6 81 / 8 57 75 - 10 45
Fax.: +49 6 81 / 8 57 75 - 22 35
Internet: www.dfki.de

Publications

2017

P. Trampert, J. Vogelgesang, C. Schorr, M. Maisl, S. Bogachev, N. Marniok, A. Louis, T. Dahmen, and P. Slusallek
Spherically symmetric volume elements as basis functions for image reconstructions in computed laminography.
Journal of X-Ray Science and Technology, 25(4): 533-546, 2017
[doi>10.3233/XST-16230]
A. Kruglova, M. Roland, S. Diebels, T. Dahmen, P. Slusallek, and F. Mücklich
Modelling and characterization of ductile fracture surface in Al-Si alloys by means of Voronoi tessellation
Materials Characterization, 131: 1-11, 2017
[doi>10.1016/j.matchar.2017.06.013]

2016

T. Dahmen, N. de Jonge, P. Trampert, M. Engstler, and C. Pauly
Smart Microscopy: Feature Based Adaptive Sampling for Focused Ion Beam Scanning Electron Microscopy
Microscopy and Microanalysis, 22(3): 632-633, 2016
[pdf] [doi>10.1017/S1431927616004013]
T. Dahmen, M. Engstler, C. Pauly, P. Trampert, N. de Jonge, F. Mücklich, and P. Slusallek
Feature Adaptive Sampling for Scanning Electron Microscopy
Scientific Reports, 6, 2016
[doi>10.1038/srep25350]
T. Dahmen, H. Kohr, A. Lupini, J. Beaudoin, C. Kübel, P. Trampert, P. Slusallek, and N. de Jonge
Combined Tilt- and Focal-Series Tomography for HAADF-STEM
Microscopy Today, 24(3): 26-30, 2016
[doi>10.1017/S1551929516000328]
P. Trampert, D. Chen, S. Bogachev, T. Dahmen, and P. Slusallek
Dictionary-based Filling of the Missing Wedge in Electron Tomography
Microscopy and Microanalysis, 22(3): 554-555, 2016
[doi>10.1017/S1431927616003627]
P. Trampert, S. Bogachev, T. Dahmen, and P. Slusallek
A Comparative Study of Three Marker Detection Algorithms in Electron Tomography
Microscopy and Microanalysis, 22(3): 1044-1045, 2016
[doi>10.1017/s1431927616006061]
T. Dahmen, P. Trampert, N. de Jonge, and P. Slusallek
Advanced recording schemes for electron tomography
MRS Bulletin, 41(7): 537-541, 2016
[doi>10.1557/mrs.2016.135]

2015

T. Dahmen, M. Roland, T. Tjardes, P. Slusallek, and S. Diebels
An automated workflow for the biomechanical simulation of a tibia with implant using computed tomography and the finite element method
Computers and Mathematics with Applications
T. Dahmen, L. Marsalek, N. Marniok, B. Turoňová, S. Bogachev, P. Trampert, S. Nickels, and P. Slusallek
Ettention: building blocks for iterative reconstruction algorithms
Proceedings of Microscopy & Microanalysis 2015, Portland, 2.-7. August 2015
T. Dahmen, L. Marsalek, N. Marniok, B. Turoňová, S. Bogachev, P. Trampert, S. Nickels, and P. Slusallek
The Ettention software package
Ultramicroscopy
[doi>10.1016/j.ultramic.2015.10.012]
P. Trampert, S. Bogachev, N. Marniok, T. Dahmen, and P. Slusallek
Marker Detection in Electron Tomography: A Comparative Study
Microscopy and Microanalysis, 21(6): 1591-1601, 2015
[doi>10.1017/S1431927615015433]
T. Dahmen, H. Kohr, N. de Jonge, and P. Slusallek
Matched Backprojection Operator for Combined Scanning Transmission Electron Microscopy Tilt- and Focal Series
Microscopy & Microanalysis
[doi>10.1017/S1431927615000525]
T. Dahmen, H. Kohr, N. de Jonge, and P. Slusallek
Reconstruction Strategies for Combined Tilt- and Focal Series Scanning Transmission Electron Microscopy
Proceedings of Microscopy & Microanalysis 2015, Portland, 2.-7. August 2015

2014

T. Dahmen, J. P. Baudoin, A. Lupini, C. Kuebel, P. Slusallek, and N. de Jonge
Combined tilt- and focal series scanning transmission electron microscopy: TFS 3D STEM
Proceedings of 18th International Microscopy Congress, Prague, September, 2014
M. Roland, T. Dahmen, T. Tjardes, R. Otchwemah, P. Slusallek, and S. Diebels
Optimized patient-specific implants
Proceedings of 11th World Congress on Computational Mechanics , Barcelona, Spain, 20.-25.Juni
[doi>10.13140/2.1.1400.5124]
T. Dahmen, J. Baudoin, A. Lupini, C. Kübel, P. Slusallek, and N. de Jonge
Combined Scanning Transmission Electron Microscopy Tilt- and Focal Series
Microscopy and Microanalysis
[doi>10.1017/S1431927614000075]
T. Dahmen, P. Slusallek, and N. de Jonge
TFS: Combined Tilt- and Focal Series for Scanning Transmission Electron Microscopy.
Proceedings of Microscopy & Microanalysis 2014, Hartford, CA, September, 2014
[doi>10.1017/S1431927614005650]

2006

I. Wald, A. Dietrich, C. Benthin, A. Efremov, T. Dahmen, J. Günther, V. Havran, H. Seidel, and P. Slusallek
Applying Ray Tracing for Virtual Reality and Industrial Design
Proceedings of the 2006 IEEE Symposium on Interactive Ray Tracing, pp. 177-185

2005

I. Wald, C. Benthin, A. Efremov, T. Dahmen, J. Günther, A. Dietrich, V. Havran, P. Slusallek, and H. Seidel
A Ray Tracing based Virtual Reality Framework for Industrial Design

2004

J. Schmittler, D. Pohl, T. Dahmen, C. Vogelgesang, and P. Slusallek
Ray Tracing for Current and Future Games
Proceedings of 34. Jahrestagung der Gesellschaft für Informatik

2002

C. Benthin, I. Wald, T. Dahmen, and P. Slusallek
Interactive Headlight Simulation -- A Case Study for Distributed Interactive Ray Tracing
Proceedings of EUROGRAPHICS Workshop on Parallel Graphics and Visualization (PGV), pp. 81-88