Feature Adaptive Sampling for Scanning Electron Microscopy
Dahmen, Tim, Kohr, Holger, Lupini, Andrew, Beaudoin, Jean-Pierre, Kübel, Christian, Trampert, Patrick, Slusallek, Philipp and de Jonge, Niels
A new aid to tomography in the scanning transmission electron microscope (STEM) is called combined tilt- and focal-series (CTFS). This software controls the recording of a tilt series where for each specimen tilt an entire focal series is recorded. This approach is particularly useful for thick specimens where the tilt range may be limited. Use of CTFS leads to a significant reduction of the missing wedge effect and a better representation of the 3D shapes of features in the specimen.
Microscopy Today 24(3) pp. 26-30